SE200x Inline PL Mapping and AOI Defect Inspection
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Inline Thin Film Measurement
Production-line measurement systems for in-process thickness and optical metrology, sampling perovskite and multi-layer films at full line speed with no sample preparation — built for closed-loop process control.
Metrology Solutions
for Perovskite Full-Stack Films
To Measure: Thickness & Uniformity, Transmittance, Reflectance, EL/PL Mapping, Single Point PL, AOI, LAB, Roughness, Glass Warpage, Color Difference, Sheet Resistance
Inline Production Line Measurement
How we measure thin film thickness
Every TDM instrument below is built on the same optical measurement principles. These three guides explain them in detail:
- Thin film thickness — definitions, units, test conditions and the published range of every TDM model.
- How to measure thin film thickness — spectral reflectance, ellipsometry, profilometry and 3D imaging compared.
- Thin film measurement equipment buyer's guide — the three decisions behind any instrument purchase.